ElectriMulti75-G

Electrical, Force Modulation AFM Probe

Rotated, monolithic silicon AFM probe with symmetric tip shape, designed for force modulation, pulsed force mode (PFM) and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs). Consistent high quality at a lower price!

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 25 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 28 µm 23 - 33 µm -
thikness 3 µm 2 - 4 µm -
force_constant 3 N/m 1 - 1 N/m -
resonance_frequency 75 kHz 60 - 90 kHz -
BudgetSensors
Артикул Цена Количество
369--Multi75E-G-10 31071.4
369--Multi75E-G-50 103867.48