ElectriCont-G

Electrical, Contact Mode AFM Probe

Rotated, monolithic silicon AFM probe with symmetric tip shape, for contact mode and electric modes like:
- Scanning Capacitance Microscopy (SCM),
- Electrostatic Force Microscopy (EFM),
- Kelvin probe Force Microscopy (KFM),
- Scanning probe lithography;

The AFM holder chip fits most commercial AFMs as it is industry standard size. It is compatible with DI/Veeco AFMs, TM Microscopes, JEOL, Molecular Imaging, and other commercial atomic force microscopes (AFMs).

Consistent high quality at a lower price!

tip

shape: Rotated

typicalfrom_toguaranteed
height 17 µm 15 - 19 µm -
setback 15 µm 10 - 20 µm -
radius 25 nm - -
half_cone_angle - - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 45 - 55 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.07 - 0.07 N/m -
resonance_frequency 13 kHz 9 - 17 kHz -
BudgetSensors
Артикул Цена Количество
368--ContE-G-10 31071.4
368--ContE-G-50 103867.48