Diamond Coated Force Modulation AFM Probe

The DT-FMR probe is designed for force modulation microscopy. The force constant of this cantilever type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM probe serves also as a basis for magnetic coatings (MFM).Furthermore non-contact or tapping mode operation is possible with the FM sensor but with reduced operation stability.

For applications that require hard contact between tip and sample this sensor offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature lies in the range between 100 and 200 nm. Nanoroughnesses in the 10 nm regime improve the resolution on flat surfaces.

    The probe offers unique features:
        - real diamond coating
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


shape: Standard



shape: beam

length 225 µm 215 - 235 µm -
width 27.5 µm 20 - 35 µm -
thikness 3 µm 2 - 4 µm -
force_constant 6.2 N/m 1.5 - 1.5 N/m -
resonance_frequency 105 kHz 65 - 155 kHz -
Артикул Цена Количество
361--DT-FMR-10 115666.56
361--DT-FMR-20 200577.75
361--DT-FMR-50 432766.68