DT-CONTR

Diamond Coated Contact Mode AFM Probe

NANOSENSORS DT-CONTR probes are designed for contact mode (repulsive mode) AFM imaging. The CONT type is optimized for high sensitivity due to a low force constant.

For applications that require hard contact between tip and sample this SPM probe offers a real diamond tip-side coating. This coating features extremely high wear resistance due to the unsurpassed hardness of diamond. The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces. 


    The probe offers unique features:
        - real diamond coating
        - high mechanical Q-factor for high sensitivity

tip

shape: Standard

typicalfrom_toguaranteed
radius 100 nm - 200 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.5 N/m 0.1 - 0.1 N/m -
resonance_frequency 20 kHz 11 - 29 kHz -
NANOSENSORS
Артикул Цена Количество
360--DT-CONTR-10 115666.56
360--DT-CONTR-20 200577.75
360--DT-CONTR-50 432766.68