CONTSC

Contact Mode AFM Probe with Short Cantilever

NanoWorld Pointprobe® CONTSC AFM probe is an alternative cantilever type for contact mode applications. The length of cantilever is reduced with respect to the preferred contact mode type enabling easier exchange with non-contact mode probes for some AFM instruments. Additionally, this probe type allows the application for lateral or friction force mode.

All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally this probes offers excellent tip radius of curvature.

tip

shape: Standard

typicalfrom_toguaranteed
height - 10 - 15 µm -
radius 8 nm - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 220 - 230 µm -
width 48 µm 42.5 - 52.5 µm -
thikness 1 µm 0.5 - 1.5 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 23 kHz 10 - 39 kHz -
NanoWorld
Артикул Цена Количество
352--CONTSC-10 35285.36
352--CONTSC-20 56776.53
352--CONTSC-50 115771.9
352--CONTSC-W 553292.32