CONT

Standard Contact Mode AFM Probe

NanoWorld Pointprobe® CONT probes are designed for contact mode imaging. Furthermore this probe can be used for force-distance spectroscopy mode or pulsed force mode (PFM). The CONT type is optimised for high sensitivity due to a low force constant.
All probes of the Pointprobe® series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The tip is shaped like a polygon based pyramid.

Additionally this probe offers excellent tip radius of curvature.

tip

shape: Standard

typicalfrom_toguaranteed
height - 10 - 15 µm -
radius 8 nm - 12 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 445 - 455 µm -
width 50 µm 45 - 55 µm -
thikness 2 µm 1.5 - 2.5 µm -
force_constant 0.2 N/m 0.07 - 0.07 N/m -
resonance_frequency 13 kHz 9 - 17 kHz -
NanoWorld
Артикул Цена Количество
609--CONT-10 35285.36
609--CONT-20 56776.53
609--CONT-50 115771.9
609--CONT-W 553292.32