CNT500_ArrowNCR_3

High-Aspect-Ratio, Tilt Compensated Special Tapping Mode AFM Probe

For the nanotools® M*-CNT-500 we pushed our proofen EBD technology to the dimensions of a CNT, maintaining EBD´s key strength. Our M*-CNT-500 is not using a multiwall carbon nanotube attached to a silicon cantilever.

What is critical in nanotube technology is solved for the M*-CNT-500:

• controlled tip length
• controlled tip orientation (angle accuracy better 0.5 deg)
• automated fabrication process

The high aspect ratio part of the probe is made from HIGH-DENSITY, DIAMOND LIKE CARBON( HDC/DLC).

• high aspect ratio
• hydrophobic surface properties
• high stiffness/elastic modulus (8 x of that of silicon)
• low thermal mass
• abrasion resistance

tip spec:

shape:                      cylindrical
length:                     500 nm +/- 100
diameter:                 20 nm +/- 5
tilt compensation:   3 deg +/- 0.5

Our HDC dissipates static charge. This leads to probes offering the extreme durability of diamond together with high resolution imaging capability. Applying our patented EBD techninque we ensure a stiff and rigid high aspect ratio probe of superior symmetry and nanometer precision.

tip

shape: High-Aspect-Ratio, Arrow, EBD

typicalfrom_toguaranteed
height 0.5 µm 0.4 - 0.6 µm -
radius 5 nm - 7 nm

cantilever

shape: beam

typicalfrom_toguaranteed
length 160 µm 155 - 165 µm -
width 45 µm 40 - 50 µm -
thikness 4.6 µm 4.1 - 5.1 µm -
force_constant 42 N/m 27 - 27 N/m -
resonance_frequency 285 kHz 240 - 380 kHz -
NanoTools
Артикул Цена Количество
632--CNT500_ArrowNCR_3-2 108081.44
632--CNT500_ArrowNCR_3-5 218697.76
632--CNT500_ArrowNCR_3-25 1042953.91
632--ESD-Kit 15374.42