CDT-NCLR

Diamond Coated, Conductive Tapping Mode AFM Probe with Long Cantilever

NANOSENSORS™ CDT-NCLR probes are designed for non-contact mode or tapping mode AFM (also known as: attractive or dynamic mode). The NCL type is offered as an alternative to the NANOSENSORS™ high frequency non-contact type (NCH). The CDT-NCLR probe is recommended if the feedback loop of the microscope does not accept high frequencies (400 kHz) or if the detection system needs a minimum cantilever length > 125 µm. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This sensor type combines high operation stability with outstanding sensitivity and fast scanning ability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.


    The probe offers unique features:
        - real diamond coating, highly doped
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series

 

tip

shape: Standard

typicalfrom_toguaranteed

cantilever

shape: beam

typicalfrom_toguaranteed
length 225 µm 215 - 235 µm -
width 37.5 µm 30 - 45 µm -
thikness 7 µm 6 - 8 µm -
force_constant 72 N/m 34 - 34 N/m -
resonance_frequency 210 kHz 155 - 275 kHz -
NANOSENSORS
Артикул Цена Количество
338--CDT-NCLR-10 142530.52
338--CDT-NCLR-20 248722.19
338--CDT-NCLR-50 530958.36