Diamond Coated, Conductive Force Modulation AFM Probe

NANOSENSORS™ CDT-FMR probes are designed for force modulation microscopy. The force constant of this probe type spans the gap between contact and non-contact mode and is specially tailored for the force modulation mode. The FM sensor serves also as a basis for magnetic coatings (MFM). Furthermore non-contact or tapping mode operation is possible with the FM probe but with reduced operation stability.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.

    The probe offers unique features:
        - real diamond coating, highly doped
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
          of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


shape: Standard



shape: beam

length 225 µm 215 - 235 µm -
width 27.5 µm 20 - 35 µm -
thikness 3 µm 2 - 4 µm -
force_constant 6.2 N/m 1.5 - 1.5 N/m -
resonance_frequency 105 kHz 65 - 155 kHz -
Артикул Цена Количество
336--CDT-FMR-10 142530.52
336--CDT-FMR-20 248722.19
336--CDT-FMR-50 530958.36