CDT-CONTR

Diamond Coated, Conductive Contact Mode AFM Probe

NANOSENSORS™ CDT-CONTR probes are designed for contact mode (repulsive mode) SPM imaging.

For applications that require a wear resistant and an electrically conductive tip we recommend this type. Some applications are Tunneling AFM and Scanning Capacitance Microscopy (SCM). The CDT Diamond Coating is highly doped and the total resistance measured in contact to a platinium surface is < 10 kOhm.

The typical macroscopic tip radius of curvature is between 100 and 200 nm. Nanoroughness in the 10 nm regime improves the resolution on flat surfaces.


    The probe offers unique features:
        - real diamond coating, highly doped
        - high mechanical Q-factor for high sensitivity

tip

shape: Standard

typicalfrom_toguaranteed

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.5 N/m 0.1 - 0.1 N/m -
resonance_frequency 20 kHz 11 - 29 kHz -
NANOSENSORS
Артикул Цена Количество
335--CDT-CONTR-10 142530.52
335--CDT-CONTR-20 248722.19
335--CDT-CONTR-50 530958.36