B50_NCHR

Special Nanoindentation AFM probe

For applications that require hard contact between tip and sample this SPM probe offers a hemispherical, symmetric and extremely smooth hard tipside coating. This coating, made of EBD diamond like carbon, features extremely high wear resistance. The types B50, B100 and B150 with radii 50 nm, 100 nm and 150 nm are available from stock - other dimensions with up to 500 nm radius are available upon request.

The probe offers unique features:

- EBD, high density carbon tip
- reliable and precise tip dimensions
- clean, smooth surface; no tip artifacts due to nanoroughness
- hydrophobic surface properties
- high mechanical Q-factor of cantilever for high sensitivity
- Tip radius: 50nm +/- 10 %

tip

shape: Standard, Rotated, Sphere, EBD

typical from_to guaranteed
radius 50 nm - -

cantilever

shape: beam

typical from_to guaranteed
length 125 µm 115 - 135 µm -
width 30 µm 22.5 - 37.5 µm -
thikness 4 µm 3 - 5 µm -
force_constant 42 N/m 10 - 10 N/m -
resonance_frequency 330 kHz 204 - 497 kHz -
NanoTools
Артикул Цена Количество
330--B50_NCHR-25 482069.95
330--B50_NCHR-5 113348.01
330--ESD-Kit 15374.42