B50_CONTR

Special Nanoindentation AFM probe

For applications that require hard contact between tip and sample this SPM probe offers a hemispherical, symmetric and extremely smooth hard tipside coating. This coating, made of EBD diamond like carbon, features extremely high wear resistance. The types B50, B100 and B150 are available from stock - other dimensionswith up to 500 nm radius are available upon request.

The probe offers unique features:

- EBD, high density carbon tip
- reliable and precise tip dimensions
- clean, smooth surface; no tip artifacts due to nanoroughness
- hydrophobic surface properties
- high mechanical Q-factor of cantilever for high sensitivity
- tip radius: 50nm +/- 10 %

tip

shape: Sphere, Standard, Rotated, EBD

typicalfrom_toguaranteed
radius 50 nm - -

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 13 kHz 6 - 21 kHz -
NanoTools
Артикул Цена Количество
328--B50_CONTR-5 128097.72
328--B50_CONTR-25 542546.73
328--ESD-Kit 15374.42