B2_CONTR

Special Nanoindentation AFM probe

For applications that require hard contact between tip and sample this SPM probe offers a hemispherical, symmetric and extremely smooth hard tipside coating. This coating, made of EBD diamond like carbon, features extremely high wear resistance. The types B1 and B2 are available from stock.

The probe offers unique features:

- EBD, high density carbon tip
- reliable and precise tip dimensions
- clean, smooth surface; no tip artifacts due to nanoroughness
- hydrophobic surface properties
- high mechanical Q-factor of cantilever for high sensitivity
- tip radius: 30-50 nm

tip

shape: Sphere, Standard, Rotated, EBD

typicalfrom_toguaranteed

cantilever

shape: beam

typicalfrom_toguaranteed
length 450 µm 440 - 460 µm -
width 50 µm 42.5 - 57.5 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 13 kHz 6 - 21 kHz -
NanoTools
Артикул Цена Количество
325--B2_CONTR-5 128097.72
325--B2_CONTR-25 542546.73
325--ESD-Kit 15374.42