Contact Mode AFM Probe with REAL Tip Visibility

NANOSENSORS™ AdvancedTEC™ Cont AFM probes are designed for contact mode imaging. They feature a tetrahedral tip that protrudes from the very end of the cantilever. This unique feature allows precise positioning and makes the AdvancedTEC™ the only AFM scanning probe in the world that offers REAL TIP VISIBILITY FROM TOP, even when the probe is tilted due to its mounting onto the AFM head. This feature makes them the premium choice for all applications where the tip has to be placed exactly on the point of interest and/or has to be visible (e.g. Nanomanipulation).

Due to their very small half cone angles the tips of the AdvancedTEC™ Series show great performance on samples that have a small pattern size combined with steep sample features.

    The probe offers unique features:
        - excellent tip radius of curvature
        - monolithic silicon
        - highly doped to dissipate static charge
        - chemically inert
        - high mechanical Q-factor for high sensitivity


shape: Visible

height - 15 - 20 µm -
radius 10 nm - -
half_cone_angle - - -


shape: beam

length 450 µm 440 - 460 µm -
width 50 µm 45 - 55 µm -
thikness 2 µm 1 - 3 µm -
force_constant 0.2 N/m 0.02 - 0.02 N/m -
resonance_frequency 15 kHz 7 - 25 kHz -
Артикул Цена Количество
307--ATEC-CONT-10 48453.97
307--ATEC-CONT-20 80269.33
307--ATEC-CONT-50 167392.86
307--ESD-Kit 15374.42