Electrical, Tapping Mode AFM Probe with Tip at the Very End of the Cantilever

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ NCPt AFM probes are designed for non-contact or tapping mode imaging. This probe type combines high operation stability with outstanding sensitivity and fast scanning ability. All SPM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip.

Additionally this AFM tip offers an excellent tip radius of curvature.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.


shape: Arrow

height - 10 - 15 µm -
radius 10 nm - -


shape: beam

length 160 µm 155 - 165 µm -
width 45 µm 40 - 50 µm -
thikness 4.6 µm 4.1 - 5.1 µm -
force_constant 42 N/m 27 - 27 N/m -
resonance_frequency 285 kHz 240 - 380 kHz -
Артикул Цена Количество
298--ARROW-NCPt-10 43818.62
298--ARROW-NCPt-20 72473.51
298--ARROW-NCPt-50 150747.73
298--ARROW-NCPt-W 731647.97