Electrical, Force Modulation AFM Probe with Tip at the Very End of the Cantilever

Silicon based beam deflection cantilever for electrostatic force mode. Rectangular cantilever that is shaped like an arrow. PtIr5 coating on both sides. PtIr-coating on both sides.Wide detector side for easy adjustment of the detection system, small width at the tip side reduces damping . The unique Arrow™ shape of the cantilever allows easy positioning of the tip on the area of interest. Tip radius with coating less than 25 nm.


shape: Arrow



shape: undefined

width 35 µm 30 - 40 µm -
thikness 3 µm 2.5 - 3.5 µm -
force_constant 2.8 N/m 1.4 - 1.4 N/m -
resonance_frequency 75 kHz 58 - 97 kHz -
Артикул Цена Количество
294--ARROW-EFM-10 43818.62
294--ARROW-EFM-20 72473.51
294--ARROW-EFM-50 150747.73
294--ARROW-EFM-W 731647.97