Contact Mode AFM Probe with Tip at the Very End of the Cantilever

Optimized positioning through maximized tip visibility

NanoWorld Arrow™ CONT probes are designed for Contact Mode imaging. Furthermore this type can be used for Force Distance Spectroscopy Mode or Pulsed Force Mode (PFM). The CONT type is optimized for high sensitivity due to a low Force Constant.

All SPM and AFM probes of the Arrow™ series are made from monolithic silicon which is highly doped to dissipate static charge. They are chemically inert and offer a high mechanical Q-factor for high sensitivity. The probes feature a rectangular cantilever with a triangular free end and a tetrahedral tip with a height of 10 - 15 µm.

Additionally this probe offers a typical tip radius of curvature of less than 10 nm.

The unique Arrow™ shape with the tip position at the very end of the cantilever allows easy positioning of the tip on the area of interest.

The reflex coating on the detector side of the cantilever enhances its reflectivity and prevents light from interfering within the cantilever.


shape: Arrow

height - 10 - 15 µm -
radius 10 nm - -


shape: beam

length 450 µm 445 - 455 µm -
width 45 µm 40 - 50 µm -
thikness 2 µm 1.5 - 2.5 µm -
force_constant 0.2 N/m 0.06 - 0.06 N/m -
resonance_frequency 14 kHz 10 - 19 kHz -
Артикул Цена Количество
293--ARROW-CONTR-10 34337.22
293--ARROW-CONTR-20 55407
293--ARROW-CONTR-50 112400.74
293--ARROW-CONTR-W 536541.85