High-Aspect-Ratio, Tapping Mode AFM Probe with Long Cantilever

NANOSENSORS™ AR5-NCLR AFM tips are designed for non-contact or tapping mode AFM. The NCL probe is designed for SPM systems requiring a minimum cantilever length > 125 µm or a resonance frequency of less than 400 kHz. Compared to the high frequency non-contact type NCH the maximum scanning speed is slightly reduced. This cantilever type combines high operation stability with outstanding sensitivity and fast scanning ability.

For measurements on samples with sidewall angles approaching 90° NANOSENSORS™ produces specially tailored tips. These tips are FIB (Focused Ion Beam) milled to achieve a high aspect ratio portion better than 5:1 at the end of the common silicon tip. This subtractive method of producing the high aspect ratio needle offers the advantage of high lateral stiffness and rigidity of the tip.

    The probe offers unique features:
        - length of the high aspect ratio portion of the tip > 2 µm
        - typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along
          cantilever axis)
        - excellent tip radius of curvature
        - highly doped to dissipate static charge
        - high mechanical Q-factor for high sensitivity
        - precise alignment of the cantilever position (within +/- 2 µm) in conjunction with the usage
        of the alignment chip
        - compatible with PointProbe® Plus XY-Alignment Series


shape: High-Aspect-Ratio

half_cone_angle - - -


shape: beam

length 225 µm 215 - 235 µm -
width 38 µm 30 - 45 µm -
thikness 7 µm 6 - 8 µm -
force_constant 48 N/m 21 - 21 N/m -
resonance_frequency 190 kHz 146 - 236 kHz -
Артикул Цена Количество
288--AR5-NCLR-10 88802.59
288--AR5-NCLR-20 152433.31
288--AR5-NCLR-50 326680.36
288--AR5-NCLR-W 1571594.59
288--ESD-Kit 15374.42